[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Electromigration behavior in aluminum wires for power base-station applications
van der Wel, Paul J., Otte, Rik, Roberts, Harry, de Bruijn, Frank, van Zuijlen, Albert, Merkus, BenYear:
2017
Language:
english
DOI:
10.1109/IRPS.2017.7936381
File:
PDF, 1010 KB
english, 2017