[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Impact of the electronic band structure on the reliability of triple layer a-VMCO devices
Belmonte, Attilio, Govoreanu, Bogdan, Subhechha, Subhali, Di Piazza, Luca, Goux, Ludovic, Kar, Gouri SankarYear:
2017
Language:
english
DOI:
10.1109/IRPS.2017.7936392
File:
PDF, 1.29 MB
english, 2017