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[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - RTN impact on data-retention failure/recovery in scaled (∼1Ynm) TLC NAND flash memories
Aritome, Seiichi, Takahashi, Tomonori, Mizoguchi, Kyoji, Takeuchi, KenYear:
2017
Language:
english
DOI:
10.1109/IRPS.2017.7936395
File:
PDF, 491 KB
english, 2017