[IEEE 2017 Annual IEEE International Systems Conference...

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[IEEE 2017 Annual IEEE International Systems Conference (SysCon) - Montreal, QC, Canada (2017.4.24-2017.4.27)] 2017 Annual IEEE International Systems Conference (SysCon) - Experiences gained from modeling and solving large mapping problems during system design

Hilbrich, Robert, Behrisch, Michael
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Year:
2017
Language:
english
DOI:
10.1109/SYSCON.2017.7934795
File:
PDF, 1.33 MB
english, 2017
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