[IEEE 2017 Annual IEEE International Systems Conference (SysCon) - Montreal, QC, Canada (2017.4.24-2017.4.27)] 2017 Annual IEEE International Systems Conference (SysCon) - Experiences gained from modeling and solving large mapping problems during system design
Hilbrich, Robert, Behrisch, MichaelYear:
2017
Language:
english
DOI:
10.1109/SYSCON.2017.7934795
File:
PDF, 1.33 MB
english, 2017