![](/img/cover-not-exists.png)
[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - Using ILA testing for BIST in FPGAs
Stroud, C., Lee, E., Konala, S., Abramovici, M.Year:
1996
Language:
english
DOI:
10.1109/TEST.1996.556946
File:
PDF, 794 KB
english, 1996