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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Unconventional Imaging and Wavefront Sensing XII - Comparison of polychromatic wave-optics models

Dolne, Jean J., Karr, Thomas J., Dayton, David C., Van Zandt, Noah R., Spencer, Mark F., Steinbock, Michael J., Anderson, Brian M., Hyde, Milo W., Fiorino, Steven T.
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Volume:
9982
Year:
2016
Language:
english
DOI:
10.1117/12.2237314
File:
PDF, 1.02 MB
english, 2016
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