SPIE Proceedings [SPIE Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016) - Suzhou, China (Tuesday 26 April 2016)] 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Error analysis of spherical scanning mechanism used for surface defects detection
Jiang, Wenhan, Yang, Li, Riemer, Oltmann, Li, Shengyi, Wan, Yongjian, Xiong, Haoliang, Yang, Yongying, Li, Chen, Chai, Huiting, Xv, Wenlin, Yan, Kai, Zhou, Lin, Li, Yang, Zhang, Yihui, Liu, Dong, Bai,Volume:
9683
Year:
2016
Language:
english
DOI:
10.1117/12.2243267
File:
PDF, 871 KB
english, 2016