ECS Transactions [ECS 217th ECS Meeting - Vancouver, Canada (April 25 - April 30, 2010)] - Hole-Trapping Mechanism and SILC of Dual-Layer nc-ITO Embedded ZrHfO High-k Nonvolatile Memories
Lin, Chen-Han, Yang, Chia-Han, Kuo, YueYear:
2010
Language:
english
DOI:
10.1149/1.3375611
File:
PDF, 718 KB
english, 2010