Testing multistage gain and offset trimming in a single...

Journal of Instrumentation 2015 / 12 Vol. 10; Iss. 12

Testing multistage gain and offset trimming in a single photon counting IC with a charge sharing elimination algorithm

Krzyżanowska, A., Gryboś, P., Szczygieł, R., Maj, P.
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Volume:
10
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/10/12/C12003
Date:
December, 2015
File:
PDF, 1.01 MB
english, 2015
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