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[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - A CDM-like damage mechanism for multiple power domains fabricated with Deep N-well processes
Chu, Yu-Lin, Kuo, Hsi-Yu, Young, Jinn-Wen, Tsai, Yung-Sheng, Ko, Chin-Yuan, Wang, Ming-Yi, Chang, Chuan-Li, Kiang, Bill, Wu, KennethYear:
2017
Language:
english
DOI:
10.1109/IRPS.2017.7936350
File:
PDF, 498 KB
english, 2017