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Modular Test System Architecture for Device, Circuit and System Level Reliability Testing and Condition Monitoring
Sleik, Roland, Glavanovics, Michael, Einspieler, Sascha, Muetze, Annette, Krischan, KlausYear:
2017
Language:
english
Journal:
IEEE Transactions on Industry Applications
DOI:
10.1109/TIA.2017.2724501
File:
PDF, 6.64 MB
english, 2017