P-68: Analysis and Solution of Horizontal Line Defect...

SID Symposium Digest of Technical Papers 2017 / 05 Vol. 48; Iss. 1

P-68: Analysis and Solution of Horizontal Line Defect Occurred During Reliability Test in 55' UD TFT-LCD TV with a-Si Integrated Gate Driver Technology

Zeng, LiMei, Lyv, XiaoWen, Chen, ShuJhih, Chou, YiFang, Lee, ChiaYu, Liu, Xiang, Liu, XiaoDi, Chen, RenLu, Liao, CongWei, Wang, TianHong
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Volume:
48
Language:
english
Journal:
SID Symposium Digest of Technical Papers
DOI:
10.1002/sdtp.11933
Date:
May, 2017
File:
PDF, 442 KB
english, 2017
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