ESD protection structure with reduced capacitance and overshoot voltage for high speed interface applications
Dong, Aihua, Salcedo, Javier A., Parthasarathy, Srivatsan, Zhou, Yuanzhong, Luo, Sirui, Hajjar, Jean-Jacques, Liou, Juin J.Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.03.014
Date:
March, 2017
File:
PDF, 1.53 MB
english, 2017