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Ion etching of HgCdTe: Properties, patterns and use as a method for defect studies
Izhnin, I.I., Mynbaev, K.D., Voitsekhovskii, A.V., Korotaev, A.G., Fitsych, O.I., Pociask-Bialy, M.Volume:
25
Language:
english
Journal:
Opto-Electronics Review
DOI:
10.1016/j.opelre.2017.03.007
Date:
June, 2017
File:
PDF, 4.05 MB
english, 2017