Integration of a Long Test Pattern Generator Composed of...

IFAC Proceedings Volumes 2003 / 02 Vol. 36; Iss. 1

Integration of a Long Test Pattern Generator Composed of T-Type Flip-Flops into a Scan Path

Garbolino, Tomasz, Hlawiczka, Andrzej
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
36
Language:
english
Journal:
IFAC Proceedings Volumes
DOI:
10.1016/s1474-6670(17)33756-4
Date:
February, 2003
File:
PDF, 599 KB
english, 2003
Conversion to is in progress
Conversion to is failed