A Measurement-Based Approach to Model Scaling Properties of...

IEEE Microwave and Wireless Components Letters 2016 / 11 Vol. 26; Iss. 11

A Measurement-Based Approach to Model Scaling Properties of FETs

Serino, Antonio, Ciccognani, Walter, Colangeli, Sergio, Limiti, Ernesto
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Volume:
26
Language:
english
Journal:
IEEE Microwave and Wireless Components Letters
DOI:
10.1109/lmwc.2016.2615027
Date:
November, 2016
File:
PDF, 484 KB
english, 2016
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