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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Optical Manufacturing and Testing IX - The design of MTF test system based on point light source
Fu, Rongguo, Burge, James H., Fähnle, Oliver W., Wu, Ning, Zhang, Xinlong, Williamson, Ray, Qiu, Yafeng, Chang, BenkangVolume:
8126
Year:
2011
Language:
english
DOI:
10.1117/12.890024
File:
PDF, 476 KB
english, 2011