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Gated integrator PXI-DAQ system for Thomson scattering diagnostics
Patel, Kiran, Pillai, Vishal, Singh, Neha, Thomas, Jinto, Kumar, AjaiVolume:
119
Language:
english
Journal:
Fusion Engineering and Design
DOI:
10.1016/j.fusengdes.2017.04.064
Date:
June, 2017
File:
PDF, 1.90 MB
english, 2017