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SPIE Proceedings [SPIE Critical Review Collection - Bellingham, United States (Friday 13 January 2017)] Millimeter and Microwave Engineering for Communications and Radar: A Critical Review - Millimeter-wave power HEMT technology
Yen, Huan-Chun, Tan, K. L., Lai, Richard, Chen, C. H., Biedenbender, Mike, Streit, Dwight C., Wojtowicz, MichaelVolume:
10276
Year:
2017
Language:
english
DOI:
10.1117/12.194301
File:
PDF, 1.92 MB
english, 2017