Concentric Solidification for High Temperature Laser Scanning Confocal Microscopy
Reid, Mark, Phelan, Dominic, Dippenaar, RianVolume:
44
Year:
2004
Language:
english
Journal:
ISIJ International
DOI:
10.2355/isijinternational.44.565
File:
PDF, 7.19 MB
english, 2004