![](/img/cover-not-exists.png)
Ultrafast in-situ null-ellipsometry for studying pulsed laser – Silicon surface interactions
Csontos, J., Toth, Z., Pápa, Z., Gábor, B., Füle, M., Gilicze, B., Budai, J.Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2017.03.186
Date:
March, 2017
File:
PDF, 1.95 MB
english, 2017