Ultrafast in-situ null-ellipsometry for studying pulsed...

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Applied Surface Science 2017 / 3

Ultrafast in-situ null-ellipsometry for studying pulsed laser – Silicon surface interactions

Csontos, J., Toth, Z., Pápa, Z., Gábor, B., Füle, M., Gilicze, B., Budai, J.
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Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2017.03.186
Date:
March, 2017
File:
PDF, 1.95 MB
english, 2017
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