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Microelectronics Reliability 2017 / 7

Resistive switching properties of alkaline earth oxide-based memory devices

Lee, Ke-Jing, Chang, Yu-Chi, Lee, Cheng-Jung, Wang, Li-Wen, Wang, Yeong-Her
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Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.06.080
Date:
July, 2017
File:
PDF, 2.04 MB
english, 2017
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