Structural and compositional characterization of single crystal uranium dioxide thin films deposited on different substrates
Elbakhshwan, Mohamed S., Heuser, Brent J.Volume:
636
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2017.07.020
Date:
August, 2017
File:
PDF, 1.03 MB
english, 2017