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Analyzing the Influence of the Angles of Incidence and Rotation on MBU Events Induced by Low LET Heavy Ions in a 28-nm SRAM-based FPGA
Tonfat, Jorge, Kastensmidt, Fernanda Lima, Artola, Laurent, Hubert, Guillaume, Medina, Nilberto H., Added, Nemitala, Aguiar, Vitor A. P., Aguirre, Fernando, Macchione, Eduardo L. A., Silveira, MarcileYear:
2017
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2017.2727479
File:
PDF, 1.32 MB
english, 2017