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[IEEE 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Athens, Greece (2017.4.3-2017.4.5)] 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Electrical characterization of percolating silicon nanonet FETs for sensing applications

Cazimajou, T., Legallais, M., Mouis, M., Ternon, C., Salem, B., Ghibaudo, G.
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Year:
2017
Language:
english
DOI:
10.1109/ULIS.2017.7962591
File:
PDF, 613 KB
english, 2017
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