![](/img/cover-not-exists.png)
[IEEE 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Athens, Greece (2017.4.3-2017.4.5)] 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Static and low frequency noise characterization of ultra-thin body InAs MOSFETs
Karatsori, T.A., Pastorek, M., Theodorou, C.G, Fadjie, A., Wichmann, N., Desplanque, L., Wallart, X., Bollaert, S., Dimitriadis, C.A., Ghibaudo, G.Year:
2017
Language:
english
DOI:
10.1109/ULIS.2017.7962613
File:
PDF, 925 KB
english, 2017