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SPIE Proceedings [SPIE Third International Conference on Smart Materials and Nanotechnology in Engineering - Shenzhen, China (Friday 11 November 2011)] Third International Conference on Smart Materials and Nanotechnology in Engineering - Monitoring of fatigue crack under complex environment using guided waves
Tang, Jianfei, Yan, Gang, Xu, XiwuVolume:
8409
Year:
2012
Language:
english
DOI:
10.1117/12.923212
File:
PDF, 2.19 MB
english, 2012