[IEEE 2017 American Control Conference (ACC) - Seattle, WA,...

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[IEEE 2017 American Control Conference (ACC) - Seattle, WA, USA (2017.5.24-2017.5.26)] 2017 American Control Conference (ACC) - Model Based Design (MBD) and Hardware In the Loop (HIL) validation: Curriculum development

Tulpule, Punit, Rezaeian, Ayyoub, Karumanchi, Aditya, Midlam-Mohler, Shawn
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Year:
2017
Language:
english
DOI:
10.23919/ACC.2017.7963788
File:
PDF, 399 KB
english, 2017
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