SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Developments in X-Ray Tomography X - Development of micro-tomography system for materials science at SPring-8
Stock, Stuart R., Müller, Bert, Wang, Ge, Uesugi, Kentaro, Hoshinio, Masato, Kishimoto, Hiroyuki, Mashita, RyoVolume:
9967
Year:
2016
Language:
english
DOI:
10.1117/12.2237587
File:
PDF, 443 KB
english, 2016