SPIE Proceedings [SPIE The International Conference on Quality Control by Artificial Vision 2017 - Tokyo, Japan (Sunday 14 May 2017)] Thirteenth International Conference on Quality Control by Artificial Vision 2017 - Dent detection method by high gradation photometric stereo
Nagahara, Hajime, Umeda, Kazunori, Yamashita, Atsushi, Hasebe, Akihisa, Kato, Kunihito, Tanahashi, Hideki, Kubota, NaokiVolume:
10338
Year:
2017
Language:
english
DOI:
10.1117/12.2266631
File:
PDF, 610 KB
english, 2017