Interface Trap State Characterization of...

Materials Today: Proceedings 2017 Vol. 4; Iss. 4

Interface Trap State Characterization of Metal-Insulator-Semiconductor Structures Based on Photosensitive Organic Materials

Bezzeccheri, E., Femia, A., Liguori, R., Rubino, A.
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Volume:
4
Year:
2017
Language:
english
Journal:
Materials Today: Proceedings
DOI:
10.1016/j.matpr.2017.04.112
File:
PDF, 284 KB
english, 2017
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