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Field effect transistor test structures for p-stop strip isolation studies
König, A., Bergauer, T., Dragicevic, M., Humann, B.Volume:
12
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/12/02/C02067
Date:
February, 2017
File:
PDF, 759 KB
english, 2017