![](/img/cover-not-exists.png)
[IEEE 2017 18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Erlagol (Altai Republic), Russia (2017.6.29-2017.7.3)] 2017 18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Using models of finite transition systems for checking web-service security
Kolomeets, Anton V., Shabaldina, Natalia V., Darusenkova, Ekaterina V., Yevtushenko, Nina V.Year:
2017
Language:
english
DOI:
10.1109/EDM.2017.7981731
File:
PDF, 334 KB
english, 2017