[IEEE 2017 22nd IEEE European Test Symposium (ETS) - Limassol, Cyprus (2017.5.22-2017.5.26)] 2017 22nd IEEE European Test Symposium (ETS) - Coverage-driven mixed-signal verification of smart power ICs in a UVM environment
Simon, Sebastian, Bhat, Deeksha, Rath, Alexander, Kirscher, Jerome, Maurer, LinusYear:
2017
Language:
english
DOI:
10.1109/ETS.2017.7968237
File:
PDF, 288 KB
english, 2017