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Areal Geometric Effects of a ZnO Charge-Trap Layer on Memory Transistor Operations for Embedded-Memory Circuit Applications
Yun, Da-Jeong, Bak, Jun-Yong, Byun, Chun-Won, Yoon, Sung-MinYear:
2017
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2017.2729578
File:
PDF, 469 KB
english, 2017