[IEEE 2017 XX IEEE International Conference on Soft...

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[IEEE 2017 XX IEEE International Conference on Soft Computing and Measurements (SCM) - Saint Petersburg, Russia (2017.5.24-2017.5.26)] 2017 XX IEEE International Conference on Soft Computing and Measurements (SCM) - Optimal design subsystems based on PSpice programs

Gridin, V. N., Dmitrevich, G. D., Laristov, A. I., Goan, Usokilo, Al-Noumani, Said M.A.
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Year:
2017
Language:
english
DOI:
10.1109/SCM.2017.7970548
File:
PDF, 207 KB
english, 2017
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