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we-Quatro: Radiation-hardened SRAM Cell with Parametric Process Variation Tolerance
Dang, Le Dinh Trang, Kim, Jin Sang, Chang, Ik JoonYear:
2017
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2017.2728180
File:
PDF, 585 KB
english, 2017