[IEEE 2017 American Control Conference (ACC) - Seattle, WA, USA (2017.5.24-2017.5.26)] 2017 American Control Conference (ACC) - Automatic probe landing in Atomic Force Microscopy resonance modes
Belikov, Sergey, Alexander, John, Surtchev, Marko, Malovichko, Ivan, Magonov, SergeiYear:
2017
Language:
english
DOI:
10.23919/ACC.2017.7963390
File:
PDF, 527 KB
english, 2017