Onion postharvest quality assessment with x-ray computed...

IEEE Instrumentation & Measurement Magazine 2017 / 6 Vol. 20; Iss. 3

Onion postharvest quality assessment with x-ray computed tomography – A pilot study

Speir, Richard A., Haidekker, Mark A.
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Volume:
20
Language:
english
Journal:
IEEE Instrumentation & Measurement Magazine
DOI:
10.1109/MIM.2017.7951686
Date:
June, 2017
File:
PDF, 1.28 MB
english, 2017
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