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SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2016 - Beijing, China (Monday 9 May 2016)] Optical Measurement Technology and Instrumentation - Real-time O 2 measurement in a cement kiln with a TDLAS analyzer

Gao, Yanwei, Han, Sen, Tan, JiuBin, Zhang, Yujun, Chen, Dong, He, Ying, Ku, You, Chen, Chen, Liu, Wenqing
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Volume:
10155
Year:
2016
Language:
english
DOI:
10.1117/12.2247141
File:
PDF, 309 KB
english, 2016
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