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[IEEE 2017 29th Chinese Control And Decision Conference (CCDC) - Chongqing, China (2017.5.28-2017.5.30)] 2017 29th Chinese Control And Decision Conference (CCDC) - Structural comparison of electrical capacitance tomography sensor
Wang, Yifan, Hu, Lijuan, Yan, Hua, Zhou, YinggangYear:
2017
Language:
english
DOI:
10.1109/CCDC.2017.7978601
File:
PDF, 1.04 MB
english, 2017