A Predictive Model for IC Self-Heating Based on Effective Medium and Image Charge Theories and Its Implications for Interconnect and Transistor Reliability
Ahn, Woojin, Zhang, Haojun, Shen, Tian, Christiansen, Cathryn, Justison, Patrick, Shin, Sanghoon, Alam, Muhammad AshrafulYear:
2017
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2725742
File:
PDF, 1.70 MB
english, 2017