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SPIE Proceedings [SPIE The International Conference on Micro- and Nano-Electronics 2016 - Zvenigorod, Russian Federation (Monday 3 October 2016)] International Conference on Micro- and Nano-Electronics 2016 - Fundamentals of the fast neutral beams diagnostics
Lukichev, Vladimir F., Rudenko, Konstantin V., Kudrya, V., Maishev, Yu.Volume:
10224
Year:
2016
Language:
english
DOI:
10.1117/12.2266889
File:
PDF, 391 KB
english, 2016