ENHANCEMENT OF PARTICLE TRAPPING IN THE FREE ELECTRON LASER
Bachelard, R., Antoniazzi, A., Chandre, C., Fanelli, D., Vittot, M.Volume:
39
Year:
2006
Language:
english
Journal:
IFAC Proceedings Volumes
DOI:
10.3182/20060628-3-fr-3903.00012
File:
PDF, 1.13 MB
english, 2006