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Robustness of edge states in topological quantum dots against global electric field
Qu, Jin-Xian, Zhang, Shu-Hui, Liu, Ding-Yang, Wang, Ping, Yang, WenVolume:
122
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4994909
Date:
July, 2017
File:
PDF, 1.58 MB
english, 2017