SPIE Proceedings [SPIE SPIE Optical Metrology - Munich,...

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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - Principles of radiation terrain mapping with SiPM gamma spectrometer

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Trushkina, Anna V., Ryzhova, Victoria A., Korotaev, Valery V., Denisov, Victor M., Radilov, Andrey V.
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Volume:
10329
Year:
2017
Language:
english
DOI:
10.1117/12.2269424
File:
PDF, 250 KB
english, 2017
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