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Built-In Fault Localization Circuitry for High Performance FPGA Based Implementations
Palchaudhuri, Ayan, Dhar, Anindya SundarVolume:
33
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-017-5671-z
Date:
August, 2017
File:
PDF, 2.39 MB
english, 2017