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Partition-based approach to parametric dynamic compact thermal modeling
Codecasa, Lorenzo, d’Alessandro, Vincenzo, Magnani, Alessandro, Rinaldi, Niccolò, Metzger, Andre G., Bornoff, Robin, Parry, JohnLanguage:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.06.059
Date:
July, 2017
File:
PDF, 3.69 MB
english, 2017