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[IEEE 2017 International Conference on Noise and Fluctuations (ICNF) - Vilnius, Lithuania (2017.6.20-2017.6.23)] 2017 International Conference on Noise and Fluctuations (ICNF) - Statistical analysis of 1/f noise in enclosed-gate N- and PMOS transistors
Nikolaou, Aristeidis, Mavredakis, Nikolaos, Bucher, Matthias, Habas, Predrag, Acovic, Alexandre, Meyer, ReneYear:
2017
Language:
english
DOI:
10.1109/ICNF.2017.7986018
File:
PDF, 1.40 MB
english, 2017