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A Sub-Threshold Noise Transient Simulator Based on Integrated Random Telegraph and Thermal Noise Modeling
Donato, Marco, Bahar, R. Iris, Patterson, William R., Zaslavsky, AlexanderYear:
2017
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2017.2717705
File:
PDF, 5.03 MB
english, 2017